IRT Saint Exupéry • Technological Research Institute

Accelerating science, technology research & transfers to industry

Publications


605 documents

  • Nikolena Christofi, Claude Baron, Xavier Pucel, Marc Pantel, David Canu, et al.. How to early integrate operational diagnosis objectives in model‐driven engineering processes: A methodological proposal based on fault and behavior trees. Systems Engineering, 2023, 27 (3), pp.585--597. ⟨10.1002/sys.21740⟩. ⟨hal-04397558⟩
  • Mathieu Serrurier, Franck Mamalet, Thomas Fel, Louis Béthune, Thibaut Boissin. On the explainable properties of 1-Lipschitz Neural Networks: An Optimal Transport Perspective. Conference on Neural Information Processing Systems (NeurIPS), Neural Information Processing Systems Foundation, Dec 2023, New Orleans (Louisiana), United States. ⟨hal-03693355v3⟩
  • Thomas Fel, Thibaut Boissin, Victor Boutin, Agustin Picard, Paul Novello, et al.. Unlocking Feature Visualization for Deeper Networks with Magnitude Constrained Optimization. Conference on Neural Information Processing Systems (NeurIPS), 2023, Dec 2023, New Orleans (Louisiana), United States. ⟨hal-04391346⟩
  • Hassan Hamad, Dominique Tournier, Jean-Michel Reynes, Olivier Perrotin, David Trémouilles, et al.. First results on 1.2 kV SiC MOSFET body diode robustness tests. Microelectronics Reliability, 2023, 151, pp.115264. ⟨10.1016/j.microrel.2023.115264⟩. ⟨hal-04282544⟩
  • Emilie Perret, Stéphanie Miot, Maxime Box, Raffaele D'Elia. PIÈCE CYLINDRIQUE À STRUCTURE SANDWICH, PROCÉDÉ DE FABRICATION D’UNE TELLE PIÈCE ET SON UTILISATION POUR LE STOCKAGE DE DÉCHETS RADIOACTIFS. France, N° de brevet: FR3115533A1. 2023. ⟨hal-04329451⟩
  • Agustin Martin Picard, Lucas Hervier, Thomas Fel, David Vigouroux. Influenciæ: A library for tracing the influence back to the data-points. 2023. ⟨hal-04284178⟩
  • M. Zerarka, V. Rustichelli, O. Perrotin, J.M. Reynes, David Trémouilles, et al.. New reliability model for power SiC MOSFET technologies under static and dynamic gate stress. Microelectronics Reliability, 2023, 150, pp.115190. ⟨10.1016/j.microrel.2023.115190⟩. ⟨hal-04298338⟩
  • Hassan Hamad, Dominique Tournier, Jean-Michel Reynes, Olivier Perrotin, Régis Meuret, et al.. First Results on 1.2 kV SiC MOSFET Body Diode Robustness Tests. 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2023, Toulouse, France. ⟨hal-04240602⟩
  • Pierre Roumanille, Julien Lesseur, Julien Uzanu, Hoa Le Trong, Emna Ben Romdhane, et al.. Using X-ray imaging for the study of crack development in solder reliability testing. ESRF 2023, Oct 2023, TOULOUSE, France. pp.115079, ⟨10.1016/j.microrel.2023.115079⟩. ⟨hal-04273250⟩
  • Erwann Kervennic, Thomas Louis, Michael Benguigui, Yves Bobichon, Nicolas Avaro, et al.. Embedded cloud segmentation using AI : Back on years of experiments in orbit on OPS-SAT. European Data Handling & Data Processing Conference 2023, European Space Agency (ESA), Oct 2023, Juan Les Pins, France. pp.1-8, ⟨10.23919/EDHPC59100.2023.10396625⟩. ⟨hal-04428379⟩

Powered by HAL logo

Scroll to top